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Muris, P. E. H. M., van Zuuren, F. J., Stoffels, E. J., Merckelbach, H., & Kindt, M. (1994). Coping with an ego-threat: Monitoring and blunting during an intelligence test. European Journal of Personality, 8(8), 213-221. https://doi.org/10.1002/per.2410080306
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van den Heuvel, E. P. J. (1994). Three decades of x-ray binaries, from the point of view of a theoretician. In S. S. Holt, & C. S. Day (Eds.), The Evolution of X-Ray Binaries: College Park, MD October 1993 (pp. 18-38). (AIP conference proceedings; Vol. 308). AIP Press. https://doi.org/10.1063/1.46006
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