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von Stackelberg, P., Huberts, L. C. E., Goedhart, R., & Does, R. J. M. M. (2025). Multilevel model versus recurrent neural network: A case study to predict student success or failure revisited. Journal of Quality Technology, 57(2), 161-180. https://doi.org/10.1080/00224065.2024.2435870 -
von Stackelberg, P., Goedhart, R., Birbil, S. I., & Does, R. J. M. M. (2024). Comparison of threshold tuning methods for predictive monitoring. Quality and Reliability Engineering International, 40(1), 499-512. https://doi.org/10.1002/qre.3436
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