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Results: 5
Number of items: 5
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Evrard, Q., Sadegh, N., Mathew, S., Zuidinga, E., Watts, B., Paradiz Dominguez, M., Giglia, A., Mahne, N., Nannarone, S., Nishimura, A., Goya, T., Sugioka, T., Vockenhuber, M., Ekinci, Y., & Brouwer, A. M. (2024). CCDC 2332946: Experimental Crystal Structure Determination [Data set]. Cambridge Crystallographic Data Centre. https://doi.org/10.5517/ccdc.csd.cc2j9mbt
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Evrard, Q., Sadegh, N., Mathew, S., Zuidinga, E., Watts, B., Paradiz Dominguez, M., Giglia, A., Mahne, N., Nannarone, S., Nishimura, A., Goya, T., Sugioka, T., Vockenhuber, M., Ekinci, Y., & Brouwer, A. M. (2024). Extreme Ultraviolet Photoresponse of Organotin-Based Photoresists with Borate Counteranions. ACS Applied Materials and Interfaces, 16(32), 42947–42956. https://doi.org/10.1021/acsami.4c08636 -
Sadegh, N., Evrard, Q., Kraus, P. M., & Brouwer, A. M. (2024). XUV Absorption Spectroscopy and Photoconversion of a Tin-Oxo Cage Photoresist. Journal of Physical Chemistry C, 128(9), 3965-3974. https://doi.org/10.1021/acs.jpcc.3c07480 -
Sadegh, N., Evrard, Q., Mahne, N., Giglia, A., Nannarone, S., & Brouwer, A. M. (2023). Electron Generation in Tin-oxo Cage Extreme Ultraviolet Photoresists. Journal of Photopolymer Science and Technology, 36(5), 373-378. https://doi.org/10.2494/photopolymer.36.373 -
Evrard, Q., Sadegh, N., Hsu, C. C., Mahne, N., Giglia, A., Nannarone, S., Ekinci, Y., Vockenhuber, M., Nishimura, A., Goya, T., Sugioka, T., & Brouwer, A. M. (2023). Influence of the anion in tin-based EUV photoresists properties. In D. Guerrero, & G. R. Amblard (Eds.), Advances in Patterning Materials and Processes XL: 27 February-1 March 2023, San Jose, California, United States Article 124980Z (Proceedings of SPIE; Vol. 12498). SPIE. https://doi.org/10.1117/12.2658498
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