Spectroscopic Probing of Defect-Related Energy Storage in Silicon Doped with Erbium,

Authors
Publication date 1999
Journal Physica B-Condensed Matter
Volume | Issue number 273-274
Pages (from-to) 326-329
Organisations
  • Faculty of Science (FNWI) - Institute of Physics (IoP) - Van der Waals-Zeeman Institute (WZI)
Document type Article
Published at https://doi.org/10.1016/S0921-4526(99)00467-6
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