The Use of Plackett-Burman Designs to Construct Split Plot Designs.

Authors
Publication date 2005
Journal Technometrics
Volume | Issue number 47 | 4
Pages (from-to) 495-501
Number of pages 6
Organisations
  • Faculty of Science (FNWI) - Korteweg-de Vries Institute for Mathematics (KdVI)
Abstract
Abstract
When some factors are hard to change and others are relatively easier, split-plot experiments are often an economic alternative to fully randomized designs. Split-plot experiments, with their structure of subplot arrays imbedded within whole-plot arrays, have a tendency to become large, particularly in screening situations when many factors are considered. To alleviate this problem, we explore, for the case of two-level designs, various ways to use orthogonal arrays of the Plackett-Burman type to reduce the number of individual tests. General construction principles are outlined, and the resulting alias structure is derived and discussed.
Document type Article
Published at http://www.amstat.org/publications/tech/
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