The Use of Plackett-Burman Designs to Construct Split Plot Designs.
| Authors |
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|---|---|
| Publication date | 2005 |
| Journal | Technometrics |
| Volume | Issue number | 47 | 4 |
| Pages (from-to) | 495-501 |
| Number of pages | 6 |
| Organisations |
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| Abstract |
Abstract
When some factors are hard to change and others are relatively easier, split-plot experiments are often an economic alternative to fully randomized designs. Split-plot experiments, with their structure of subplot arrays imbedded within whole-plot arrays, have a tendency to become large, particularly in screening situations when many factors are considered. To alleviate this problem, we explore, for the case of two-level designs, various ways to use orthogonal arrays of the Plackett-Burman type to reduce the number of individual tests. General construction principles are outlined, and the resulting alias structure is derived and discussed. |
| Document type | Article |
| Published at | http://www.amstat.org/publications/tech/ |
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