A new X-ray diffraction method for structural investigations of solid-liquid interfaces

Open Access
Authors
  • W.J. Huisman
  • J.F. Peters
  • J.W. Derks
  • H.G. Ficke
  • D. Abernathy
  • J.F. van der Veen
Publication date 1997
Journal Review of Scientific Instruments
Volume | Issue number 68
Pages (from-to) pp 4169
Organisations
  • Faculty of Science (FNWI) - Institute of Physics (IoP) - Van der Waals-Zeeman Institute (WZI)
Document type Article
Published at https://doi.org/10.1063/1.1148380
Downloads
Permalink to this page
Back