RD50-MPW: a series of monolithic High Voltage CMOS pixel chips with high granularity and towards high radiation tolerance

Open Access
Authors
  • C. Zhang
  • B. Pilsl
  • S. Powell
  • E. Vilella
  • S. Zhang
  • T. Bergauer
  • R. Casanova
  • C. Irmler
  • Uwe Kraemer
  • R. Marco-Hernandez
  • J. Sonneveld
  • J. Mazorra de Cos
  • P. Sieberer
  • H. Steininger
  • CERN RD50 Collaboration
Publication date 04-2024
Journal Journal of Instrumentation
Article number C04059
Volume | Issue number 19 | 4
Number of pages 6
Organisations
  • Faculty of Science (FNWI) - Institute of Physics (IoP) - Institute for High Energy Physics (IHEF)
Abstract
A series of monolithic High Voltage CMOS (HV-CMOS) pixel sensor prototypes have been developed by the CERN-RD50 CMOS working group for potential use in future high luminosity experiments. The aim is to further improve the performance of HV-CMOS sensors, especially in terms of pixel granularity, timing resolution and radiation tolerance. The evaluation of one of this series, RD50-MPW3, is presented in this contribution, including laboratory and test beam measurements. The design of the latest prototype, RD50-MPW4, which resolves issues found in RD50-MPW3 and implements further improvements, is described.
Document type Article
Language English
Published at https://doi.org/10.1088/1748-0221/19/04/C04059
Downloads
Zhang_2024_J._Inst._19_C04059 (Final published version)
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