Spectra stitching for ultra-high resolution, low sensitivity decay and high-speed SD-OCT

Authors
Publication date 2020
Host editors
  • J. Hwang
  • G. Vargas
Book title Design and Quality for Biomedical Technologies XIII
Book subtitle 1-2 February 2020, San Francisco, California, United States
ISBN
  • 9781510632257
ISBN (electronic)
  • 9781510632264
Series Proceedings of SPIE, the International Society for Optical Engineering
Event SPIE BIOS
Article number 1123104
Number of pages 9
Publisher Bellingham, WA: SPIE
Organisations
  • Faculty of Humanities (FGw) - Amsterdam Institute for Humanities Research (AIHR) - Amsterdam School for Heritage, Memory and Material Culture (AHM)
Abstract
In this study we investigate the possibility of spectra stitching in the context of Spectral Domain – Optical Coherence Tomography (SD-OCT). The aim is to reach a high axial resolution while keeping sampling issues to a low level (slow decay in depth) but still operating with the fastest camera line rate available. The paper focuses mainly on simulations of spectrometer signals and the stitching procedure. It briefly introduces the experimental system. The findings of this study are relevant to most of the SD-OCT systems and could also be transferred to Swept Source OCT (SS-OCT) where they will help to increase the axial resolution capabilities.
Document type Conference contribution
Language English
Published at https://doi.org/10.1117/12.2545157
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