E-Valuating Classifier Two-Sample Tests
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| Publication date | 24-10-2022 |
| Number of pages | 19 |
| Publisher | ArXiv |
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| Abstract |
We propose E-C2ST, a classifier two-sample test for high-dimensional data based on E-values. Compared to -values-based tests, tests with E-values have finite sample guarantees for the type I error. E-C2ST combines ideas from existing work on split likelihood ratio tests and predictive independence testing. The resulting E-values incorporate information about the alternative hypothesis. We demonstrate the utility of E-C2ST on simulated and real-life data. In all experiments, we observe that when going from small to large sample sizes, as expected, E-C2ST starts with lower power compared to other methods but eventually converges towards one. Simultaneously, E-C2ST's type I error stays substantially below the chosen significance level, which is not always the case for the baseline methods. Finally, we use an MRI dataset to demonstrate that multiplying E-values from multiple independently conducted studies leads to a combined E-value that retains the finite sample type I error guarantees while increasing the power.
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| Document type | Preprint |
| Language | English |
| Published at | https://doi.org/10.48550/arXiv.2210.13027 |
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E-Valuating Classifier Two-Sample Tests
(Submitted manuscript)
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