Erbium excitation across the bulk of silicon wafer: An Effect of p-n junction at Si/Si:Er interface

Authors
Publication date 2001
Journal Physica B-Condensed Matter
Volume | Issue number 308
Pages (from-to) 357-360
Number of pages 4
Organisations
  • Faculty of Science (FNWI) - Institute of Physics (IoP) - Van der Waals-Zeeman Institute (WZI)
Document type Article
Published at https://doi.org/10.1016/S0921-4526(01)00699-8
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